X-Git-Url: http://git.uio.no/git/?a=blobdiff_plain;f=ITS%2FAliITSCalibration.cxx;h=5699336ba1786d86c30d32e22bc702bc679b8747;hb=3bc79d8d63ea4f7065fddf6b2e0d2f54ca3f44e6;hp=90505d999a89370cb8596fc2d574aa6c445cd7b9;hpb=fcf95fc7a1a40644de272f60ebe2a9059a8ba9a7;p=u%2Fmrichter%2FAliRoot.git diff --git a/ITS/AliITSCalibration.cxx b/ITS/AliITSCalibration.cxx index 90505d999a8..5699336ba17 100644 --- a/ITS/AliITSCalibration.cxx +++ b/ITS/AliITSCalibration.cxx @@ -13,6 +13,7 @@ * provided "as is" without express or implied warranty. * **************************************************************************/ +/* $Id$ */ ////////////////////////////////////////////////////// // Calibration class for set:ITS // @@ -22,332 +23,39 @@ // AliITSCalibrationSSD // ////////////////////////////////////////////////////// -#include "Riostream.h" +#include +#include + #include "AliITSCalibration.h" +#include "AliLog.h" ClassImp(AliITSCalibration) //______________________________________________________________________ -AliITSCalibration::AliITSCalibration(){ - // Default Constructor - - fdv = 0.000375; // 300 microns and 80 volts. - fN = 0.0; - fT = 300.0; - SetGeVToCharge(); - fResponse = 0; -} -//______________________________________________________________________ -AliITSCalibration::AliITSCalibration(Double_t thickness){ - // Default Constructor - - fdv = thickness/80.0; // 80 volts. - fN = 0.0; - fT = 300.0; - SetGeVToCharge(); - fResponse = 0; -} -//______________________________________________________________________ -AliITSCalibration::AliITSCalibration(const AliITSCalibration &ob) : TObject(ob) { - // Copy constructor - // Copies are not allowed. The method is protected to avoid misuse. - Error("AliITSCalibration","Copy constructor not allowed\n"); -} - -//______________________________________________________________________ -AliITSCalibration& AliITSCalibration::operator=(const AliITSCalibration& /* ob */){ - // Assignment operator - // Assignment is not allowed. The method is protected to avoid misuse. - Error("= operator","Assignment operator not allowed\n"); - return *this; -} - -//______________________________________________________________________ -Double_t AliITSCalibration::MobilityElectronSiEmp() const { - // Computes the electron mobility in cm^2/volt-sec. Taken from SILVACO - // International ATLAS II, 2D Device Simulation Framework, User Manual - // Chapter 5 Equation 5-6. An empirical function for low-field mobiliity - // in silicon at different tempeatures. - // Inputs: - // none. - // Output: - // none. - // Return: - // The Mobility of electrons in Si at a give temprature and impurity - // concentration. [cm^2/Volt-sec] - const Double_t km0 = 55.24; // cm^2/Volt-sec - const Double_t km1 = 7.12E+08; // cm^2 (degree K)^2.3 / Volt-sec - const Double_t kN0 = 1.072E17; // #/cm^3 - const Double_t kT0 = 300.; // degree K. - const Double_t keT0 = -2.3; // Power of Temp. - const Double_t keT1 = -3.8; // Power of Temp. - const Double_t keN = 0.73; // Power of Dopent Consentrations - Double_t m; - Double_t tT = fT,nN = fN; +AliITSCalibration::AliITSCalibration(): +TObject(), +fDataType(), +fT(300.) +{ + // Default Constructor (300 microns and 80 volts) - if(nN<=0.0){ // Simple case. - if(tT==300.) return 1350.0; // From Table 5-1 at consentration 1.0E14. - m = km1*TMath::Power(tT,keT0); - return m; - } // if nN<=0.0 - m = km1*TMath::Power(tT,keT0) - km0; - m /= 1.0 + TMath::Power(tT/kT0,keT1)*TMath::Power(nN/kN0,keN); - m += km0; - return m; } -//______________________________________________________________________ -Double_t AliITSCalibration::MobilityHoleSiEmp() const { - // Computes the Hole mobility in cm^2/volt-sec. Taken from SILVACO - // International ATLAS II, 2D Device Simulation Framework, User Manual - // Chapter 5 Equation 5-7 An empirical function for low-field mobiliity - // in silicon at different tempeatures. - // Inputs: - // none. - // Output: - // none. - // Return: - // The Mobility of Hole in Si at a give temprature and impurity - // concentration. [cm^2/Volt-sec] - const Double_t km0a = 49.74; // cm^2/Volt-sec - const Double_t km0b = 49.70; // cm^2/Volt-sec - const Double_t km1 = 1.35E+08; // cm^2 (degree K)^2.3 / Volt-sec - const Double_t kN0 = 1.606E17; // #/cm^3 - const Double_t kT0 = 300.; // degree K. - const Double_t keT0 = -2.2; // Power of Temp. - const Double_t keT1 = -3.7; // Power of Temp. - const Double_t keN = 0.70; // Power of Dopent Consentrations - Double_t m; - Double_t tT = fT,nN = fN; - if(nN<=0.0){ // Simple case. - if(tT==300.) return 495.0; // From Table 5-1 at consentration 1.0E14. - m = km1*TMath::Power(tT,keT0) + km0a-km0b; - return m; - } // if nN<=0.0 - m = km1*TMath::Power(tT,keT0) - km0b; - m /= 1.0 + TMath::Power(tT/kT0,keT1)*TMath::Power(nN/kN0,keN); - m += km0a; - return m; -} -//______________________________________________________________________ -Double_t AliITSCalibration::DiffusionCoefficientElectron() const { - // Computes the Diffusion coefficient for electrons in cm^2/sec. Taken - // from SILVACO International ATLAS II, 2D Device Simulation Framework, - // User Manual Chapter 5 Equation 5-53. Einstein relations for diffusion - // coefficient. Note: 1 cm^2/sec = 10 microns^2/nanosec. - // Inputs: - // none. - // Output: - // none. - // Return: - // The Diffusion Coefficient of electrons in Si at a give temprature - // and impurity concentration. [cm^2/sec] - // const Double_t kb = 1.3806503E-23; // Joules/degree K - // const Double_t qe = 1.60217646E-19; // Coulumbs. - const Double_t kbqe = 8.617342312E-5; // Volt/degree K - Double_t m = MobilityElectronSiEmp(); - Double_t tT = fT; - - return m*kbqe*tT; // [cm^2/sec] -} -//______________________________________________________________________ -Double_t AliITSCalibration::DiffusionCoefficientHole() const { - // Computes the Diffusion coefficient for Holes in cm^2/sec. Taken - // from SILVACO International ATLAS II, 2D Device Simulation Framework, - // User Manual Chapter 5 Equation 5-53. Einstein relations for diffusion - // coefficient. Note: 1 cm^2/sec = 10 microns^2/nanosec. - // Inputs: - // none. - // Output: - // none. - // Return: - // The Defusion Coefficient of Hole in Si at a give temprature and - // impurity concentration. [cm^2/sec] - // and impurity concentration. [cm^2/sec] - // const Double_t kb = 1.3806503E-23; // Joules/degree K - // const Double_t qe = 1.60217646E-19; // Coulumbs. - const Double_t kbqe = 8.617342312E-5; // Volt/degree K - Double_t m = MobilityHoleSiEmp(); - Double_t tT = fT; - - return m*kbqe*tT; // [cm^2/sec] -} //______________________________________________________________________ -Double_t AliITSCalibration::SpeedElectron() const { - // Computes the average speed for electrons in Si under the low-field - // approximation. [cm/sec]. - // Inputs: - // none. - // Output: - // none. - // Return: - // The speed the holes are traveling at due to the low field applied. - // [cm/sec] - Double_t m = MobilityElectronSiEmp(); +AliITSCalibration::AliITSCalibration(const AliITSCalibration &ob): +TObject(ob), +fDataType(ob.fDataType), +fT(ob.fT) - return m/fdv; // [cm/sec] -} -//______________________________________________________________________ -Double_t AliITSCalibration::SpeedHole() const { - // Computes the average speed for Holes in Si under the low-field - // approximation.[cm/sec]. - // Inputs: - // none. - // Output: - // none. - // Return: - // The speed the holes are traveling at due to the low field applied. - // [cm/sec] - Double_t m = MobilityHoleSiEmp(); - - return m/fdv; // [cm/sec] -} -//______________________________________________________________________ -Double_t AliITSCalibration::SigmaDiffusion3D(Double_t l) const { - // Returns the Gaussian sigma^2 == [cm^2] due to the - // defusion of electrons or holes through a distance l [cm] caused - // by an applied voltage v [volt] through a distance d [cm] in any - // material at a temperature T [degree K]. The sigma diffusion when - // expressed in terms of the distance over which the diffusion - // occures, l=time/speed, is independent of the mobility and therefore - // the properties of the material. The charge distributions is given by - // n = exp(-r^2/4Dt)/(4piDt)^1.5. From this = 6Dt where D=mkT/e - // (m==mobility, k==Boltzman's constant, T==temparature, e==electric - // charge. and vel=m*v/d. consiquently sigma^2=6kTdl/ev. - // Inputs: - // Double_t l Distance the charge has to travel. - // Output: - // none. - // Return: - // The Sigma due to the diffution of electrons. [cm] - const Double_t kcon = 5.17040258E-04; // == 6k/e [J/col or volts] - - return TMath::Sqrt(kcon*fT*fdv*l); // [cm] -} -//______________________________________________________________________ -Double_t AliITSCalibration::SigmaDiffusion2D(Double_t l) const { - // Returns the Gaussian sigma^2 == [cm^2] due to the defusion - // of electrons or holes through a distance l [cm] caused by an applied - // voltage v [volt] through a distance d [cm] in any material at a - // temperature T [degree K]. The sigma diffusion when expressed in terms - // of the distance over which the diffusion occures, l=time/speed, is - // independent of the mobility and therefore the properties of the - // material. The charge distributions is given by - // n = exp(-r^2/4Dt)/(4piDt)^1.5. From this = 4Dt where D=mkT/e - // (m==mobility, k==Boltzman's constant, T==temparature, e==electric - // charge. and vel=m*v/d. consiquently sigma^2=4kTdl/ev. - // Inputs: - // Double_t l Distance the charge has to travel. - // Output: - // none. - // Return: - // The Sigma due to the diffution of electrons. [cm] - const Double_t kcon = 3.446935053E-04; // == 4k/e [J/col or volts] - - return TMath::Sqrt(kcon*fT*fdv*l); // [cm] -} -//______________________________________________________________________ -Double_t AliITSCalibration::SigmaDiffusion1D(Double_t l) const { - // Returns the Gaussian sigma^2 == [cm^2] due to the defusion - // of electrons or holes through a distance l [cm] caused by an applied - // voltage v [volt] through a distance d [cm] in any material at a - // temperature T [degree K]. The sigma diffusion when expressed in terms - // of the distance over which the diffusion occures, l=time/speed, is - // independent of the mobility and therefore the properties of the - // material. The charge distributions is given by - // n = exp(-r^2/4Dt)/(4piDt)^1.5. From this = 2Dt where D=mkT/e - // (m==mobility, k==Boltzman's constant, T==temparature, e==electric - // charge. and vel=m*v/d. consiquently sigma^2=2kTdl/ev. - // Inputs: - // Double_t l Distance the charge has to travel. - // Output: - // none. - // Return: - // The Sigma due to the diffution of electrons. [cm] - const Double_t kcon = 1.723467527E-04; // == 2k/e [J/col or volts] - - return TMath::Sqrt(kcon*fT*fdv*l); // [cm] -} -//---------------------------------------------------------------------- -Double_t AliITSCalibration::DepletedRegionThicknessA(Double_t dopCons, - Double_t voltage, - Double_t elecCharge, - Double_t voltBuiltIn)const{ - // Computes the thickness of the depleted region in Si due to the - // application of an external bias voltage. From the Particle Data - // Book, 28.8 Silicon semiconductor detectors equation 28.19 (2004) - // Physics Letters B "Review of Particle Physics" Volume 592, Issue 1-4 - // July 15 2004, ISSN 0370-2693 page 263. First equation. - // Inputs: - // Double_t dopCons "N" doping concentration - // Double_t voltage "V" external bias voltage - // Double_t elecCharge "e" electronic charge - // Double_t voltBuiltIn=0.5 "V_bi" "built-in" Voltage (~0.5V for - // resistivities typically used in detectors) - // Output: - // none. - // Return: - // The thickness of the depleted region - - return TMath::Sqrt(2.0*(voltage+voltBuiltIn)/(dopCons*elecCharge)); -} -//---------------------------------------------------------------------- -Double_t AliITSCalibration::DepletedRegionThicknessB(Double_t resist, - Double_t voltage, - Double_t mobility, - Double_t voltBuiltIn, - Double_t dielConst)const{ - // Computes the thickness of the depleted region in Si due to the - // application of an external bias voltage. From the Particle Data - // Book, 28.8 Silicon semiconductor detectors equation 28.19 (2004) - // Physics Letters B "Review of Particle Physics" Volume 592, Issue 1-4 - // July 15 2004, ISSN 0370-2693 page 263. Second Equation. - // Inputs: - // Double_t resist "rho" resistivity (typically 1-10 kOhm cm) - // Double_t voltage "V" external bias voltage - // Double_t mobility "mu" charge carrier mobility - // (electons 1350, holes 450 cm^2/V/s) - // Double_t voltBuiltIn=0.5 "V_bi" "built-in" Voltage (~0.5V for - // resistivities typically used in detectors) - // Double_t dielConst=1.E-12 "epsilon" dielectric constant = 11.9 * - // (permittivity of free space) or ~ 1 pF/cm - // Output: - // none. - // Return: - // The thickness of the depleted region - - return TMath::Sqrt(2.8*resist*mobility*dielConst*(voltage+voltBuiltIn)); -} -//---------------------------------------------------------------------- -Double_t AliITSCalibration::ReverseBiasCurrent(Double_t temp, - Double_t revBiasCurT1, - Double_t tempT1, - Double_t energy)const{ - // Computes the temperature dependance of the reverse bias current - // of Si detectors. From the Particle Data - // Book, 28.8 Silicon semiconductor detectors equation 28.21 (2004) - // Physics Letters B "Review of Particle Physics" Volume 592, Issue 1-4 - // July 15 2004, ISSN 0370-2693 page 263. - // Inputs: - // Double_t temp The temperature at which the current is wanted - // Double_t revBiasCurT1 The reference bias current at temp T1 - // Double_t tempT1 The temperature correstponding to revBiasCurT1 - // Double_t energy=1.2 Some energy [eV] - // Output: - // none. - // Return: - // The reverse bias current at the tempeature temp. - const Double_t kBoltz = 8.617343E-5; //[eV/K] +{ + // Copy constructor - return revBiasCurT1*(temp*temp/(tempT1*tempT1))* - TMath::Exp(-0.5*energy*(tempT1-temp)/(kBoltz*tempT1*temp)); } //---------------------------------------------------------------------- void AliITSCalibration::Print(ostream *os) const { // Standard output format for this class. // Inputs: - *os << fdv << " " << fN << " " << fT << " "; - *os << fGeVcharge; + *os << fT << " "; // printf("%-10.6e %-10.6e %-10.6e %-10.6e \n",fdv,fN,fT,fGeVcharge); return; } @@ -361,7 +69,7 @@ void AliITSCalibration::Read(istream *is) { // Return: // none. - *is >> fdv >> fN >> fT >> fGeVcharge; + *is >> fT; return; } //----------------------------------------------------------------------